{"schema":"https://ver.cy/schemas/card/1.0.0","id":"vr.tr.electron-microprobe","code":"thing-q911272","url":"https://ver.cy/models/thing/q911272/","name":"electron microprobe","alternateNames":[],"kind":"thing","status":"published","version":"0.1.0-research.1","language":"en","classifiers":{"family":"Thing Registry","category":"Physical world and living systems","entryKind":"thing","plane":"PHY","domain":["PHY.OBJ"],"industry":[],"navPath":"","tags":[],"facets":{}},"whatItIs":"An electron microprobe is an analytical instrument that determines the elemental composition of microscopic regions of a solid specimen by measuring characteristic X-rays generated by a focused electron beam.","purpose":"Enable an agent to recognise an electron microprobe, assess its analytical readiness and determine which local elemental measurements it can support.","scope":{"in":["Electron-beam generation, focusing and delivery to a specimen","Characteristic X-ray detection and spectrometer configuration","Specimen positioning, preparation compatibility and vacuum interface","Quantitative elemental analysis, calibration and measurement limitations","Instrument readiness, maintenance dependencies and protective controls"],"out":["Individual manufacturers, product lines and asset histories as independent things","Specimen identity, geological interpretation and material classification","Standalone specimen polishing and coating equipment","General scanning electron microscopy capabilities unrelated to microprobe analysis","Transmission electron microscopy and ion-beam microanalysis instruments","Laboratory accreditation and organisational safety management"],"boundaries":[]},"distinguishingFeatures":["Uses an electron beam incident on a specimen to excite characteristic X-rays for local elemental analysis, rather than using incident X-rays as an X-ray fluorescence instrument does.","Is configured around electron probe X-ray microanalysis and quantitative analytical stability; an SEM carrying an X-ray detector is an overlapping neighbour whose classification requires evidence beyond detector presence.","Commonly incorporates wavelength-dispersive spectrometers; record the actual configuration because detector type alone does not settle the boundary with an analytical SEM.","Analyses local regions of a mounted specimen rather than requiring the electron-transparent specimen geometry characteristic of transmission electron microscopy.","Measures elemental signals; elemental composition alone does not establish molecular identity, mineral phase or crystal structure."],"structure":{"bundles":[{"id":"analytical-identity","name":"Analytical identity","description":"Establishes what makes the registered kind an electron microprobe and where its analytical claims stop.","layers":[{"id":"instrument-kind","name":"Instrument kind","description":"Separates the analytical instrument kind from adjacent instruments and particular implementations.","findings":[{"id":"microprobe-classification","name":"Microprobe classification","description":"Record evidence for classification by analytical purpose and configuration, including overlap with analytical SEMs.","questions":[{"text":"What documented purpose and configuration identify this instrument as an electron microprobe?","id":"microprobe-classification-q01","kind":"definition"},{"text":"Where does the registry place the boundary between this kind and an SEM equipped for quantitative X-ray microanalysis?","id":"microprobe-classification-q02","kind":"boundary"}]}]},{"id":"signal-and-inference","name":"Signal and inference","description":"Connects measured X-rays to the conclusions the instrument can support.","findings":[{"id":"elemental-evidence","name":"Elemental evidence","description":"Distinguish measured spectral intensities, inferred composition and interpretations requiring additional evidence.","questions":[{"text":"Which outputs are measured intensities and which are calculated elemental concentrations?","id":"elemental-evidence-q01","kind":"definition"},{"text":"Which proposed phase, bonding or structural conclusions require a neighbouring analytical method?","id":"elemental-evidence-q02","kind":"boundary"}]}]}]},{"id":"electron-probe-delivery","name":"Electron probe delivery","description":"Describes how beam conditions produce and localise the analytical excitation.","layers":[{"id":"source-and-beam-control","name":"Source and beam control","description":"Captures supported settings and evidence of beam stability.","findings":[{"id":"usable-beam-conditions","name":"Usable beam conditions","description":"Record voltage, current and focus conditions as a coupled operating envelope.","questions":[{"text":"What voltage, probe current and beam diameter combinations are supported for the intended analysis?","id":"usable-beam-conditions-q01","kind":"measurement"},{"text":"How is current measured, and what drift criterion requires correction or recalibration?","id":"usable-beam-conditions-q02","kind":"action"}]}]},{"id":"specimen-interaction","name":"Specimen interaction","description":"Distinguishes beam footprint from the volume contributing X-rays.","findings":[{"id":"analytical-localisation","name":"Analytical localisation","description":"Record the evidence needed to attribute a measurement to a feature without mixing neighbouring material.","questions":[{"text":"What estimate or measurement supports the X-ray generation volume for this material, voltage and selected line?","id":"analytical-localisation-q01","kind":"measurement"},{"text":"When must analysis near an interface, thin layer or small inclusion be rejected or qualified?","id":"analytical-localisation-q02","kind":"action"}]}]}]},{"id":"x-ray-quantification","name":"X-ray quantification","description":"Connects spectrometer capabilities, standards and corrections to defensible composition measurements.","layers":[{"id":"spectral-acquisition","name":"Spectral acquisition","description":"Records accessible lines and the acquisition conditions needed to distinguish them.","findings":[{"id":"line-and-background-selection","name":"Line and background selection","description":"Associate each target element with a usable line, detector configuration and interference assessment.","questions":[{"text":"Which installed spectrometer, analysing crystal or detector configuration can measure each proposed line?","id":"line-and-background-selection-q01","kind":"measurement"},{"text":"What peak overlaps, background features and count-rate effects must the acquisition method address?","id":"line-and-background-selection-q02","kind":"action"}]}]},{"id":"calibration-and-validity","name":"Calibration and validity","description":"Makes the reference basis and limitations of reported concentrations explicit.","findings":[{"id":"quantitative-traceability","name":"Quantitative traceability","description":"Link results to reference compositions, correction methods and independent verification.","questions":[{"text":"Which reference materials, assigned compositions and matrix-correction method support the analysis?","id":"quantitative-traceability-q01","kind":"provenance"},{"text":"What verification results establish precision, detection limits and uncertainty for the target elements and matrix?","id":"quantitative-traceability-q02","kind":"measurement"},{"text":"What failed checks require restandardisation, remeasurement or qualification of the result?","id":"quantitative-traceability-q03","kind":"action"}]}]}]},{"id":"specimen-and-positioning","name":"Specimen and positioning","description":"Defines specimen acceptance and reliable placement of measurements.","layers":[{"id":"specimen-acceptance","name":"Specimen acceptance","description":"Captures mounting, surface and vacuum compatibility.","findings":[{"id":"prepared-surface-suitability","name":"Prepared surface suitability","description":"Assess the actual prepared specimen against the intended quantitative method.","questions":[{"text":"Are specimen dimensions, surface relief, mounting materials and outgassing compatible with the holder and analysis?","id":"prepared-surface-suitability-q01","kind":"measurement"},{"text":"What conductive path or coating is needed, and how could that coating affect the selected X-ray measurements?","id":"prepared-surface-suitability-q02","kind":"action"}]}]},{"id":"targeting-and-exposure","name":"Targeting and exposure","description":"Controls where measurements occur and how exposure affects their validity.","findings":[{"id":"repeatable-undisturbed-targets","name":"Repeatable and undisturbed targets","description":"Record target registration, stage constraints and evidence of specimen change during acquisition.","questions":[{"text":"How are image coordinates registered to stage positions and the required analytical focus?","id":"repeatable-undisturbed-targets-q01","kind":"measurement"},{"text":"What time-dependent signal changes indicate charging, contamination, elemental migration or beam damage?","id":"repeatable-undisturbed-targets-q02","kind":"measurement"},{"text":"When should current, beam diameter, dwell time or target location change to preserve a usable measurement?","id":"repeatable-undisturbed-targets-q03","kind":"action"}]}]}]},{"id":"operational-readiness","name":"Operational readiness","description":"Relates electron-source, vacuum, spectrometer and protective-system condition to permitted operation.","layers":[{"id":"subsystem-health","name":"Subsystem health","description":"Tracks dependencies whose degradation affects beam delivery or X-ray measurement.","findings":[{"id":"analytical-service-condition","name":"Analytical service condition","description":"Record configuration-specific checks and maintenance evidence for critical subsystems.","questions":[{"text":"Which vacuum, source-emission, spectrometer-positioning and detector checks demonstrate readiness?","id":"analytical-service-condition-q01","kind":"measurement"},{"text":"Which source parts, apertures, pumps, detector gases or other consumables apply to this configuration, and what triggers service?","id":"analytical-service-condition-q02","kind":"action"}]}]},{"id":"protective-operation","name":"Protective operation","description":"Records protective controls and the evidence governing operation and service.","findings":[{"id":"energisation-and-access","name":"Energisation and access","description":"Connect high-voltage and X-ray protection, vacuum sequencing and access restrictions to allowed actions.","questions":[{"text":"Which interlocks and verified conditions are required before beam energisation, chamber venting or specimen exchange?","id":"energisation-and-access-q01","kind":"action"},{"text":"Which manufacturer instructions, issuing-body standards and local requirements govern this configuration?","id":"energisation-and-access-q02","kind":"provenance"},{"text":"Which faults require shutdown or qualified service before analytical work resumes?","id":"energisation-and-access-q03","kind":"action"}]}]}]},{"id":"evidence-and-external-alignment","name":"Evidence and external alignment","description":"What the world already says about this thing, gathered so the model can be checked against it.","layers":[{"id":"reported-evidence","name":"Reported evidence","description":"Findings from the breadth pass, kept separate from the structural claims.","findings":[{"id":"evidence-confidence-notes","name":"Check these first","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these check these first hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-confidence-notes-q01","kind":"provenance"}]},{"id":"evidence-kinds","name":"Kinds and varieties","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these kinds and varieties hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-kinds-q01","kind":"provenance"}]},{"id":"evidence-standards-and-regulation","name":"Standards and regulation","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these standards and regulation hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-standards-and-regulation-q01","kind":"provenance"}]},{"id":"evidence-real-world-use","name":"Real-world use","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these real-world use hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-real-world-use-q01","kind":"provenance"}]},{"id":"evidence-measurements","name":"Typical measurements","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these typical measurements hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-measurements-q01","kind":"provenance"}]},{"id":"evidence-failure-modes-and-hazards","name":"Failure modes and hazards","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these failure modes and hazards hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-failure-modes-and-hazards-q01","kind":"provenance"}]},{"id":"evidence-neighbours","name":"Neighbouring kinds and how to tell them apart","description":"Recalled without web access and unsourced; every item is a lead to verify.","questions":[{"text":"Which of these neighbouring kinds and how to tell them apart hold for the sense of electron microprobe this model covers, and on what evidence?","id":"evidence-neighbours-q01","kind":"provenance"}]}]}]}]},"agentConduct":{"may":["Operate and calibrate an electron microprobe the agent is authorized to use.","Report compositions with the standards, conditions and uncertainty used."],"mustNot":["Disable interlocks or shielding on the instrument.","Report results beyond the precision the standards and calibration support.","Alter or omit analyses to change a conclusion."],"requiresHuman":["Releasing analyses used in legal, safety or commercial decisions.","Servicing parts of the instrument that involve X-ray or high-voltage exposure."]},"ethics":{"considerations":["The instrument produces X-rays; interlocks protect operators and others.","Its results can decide the value of ore, the cause of a failure or a forensic question."],"affectedParties":["Operators and laboratory staff","People relying on the results"]},"owners":{"steward":"The laboratory that operates it; radiation protection rules apply to it.","roles":[],"masterSystems":[]},"relations":[{"target":"Q2365355","type":"parent","note":"registry parent class"}],"interaction":{"identity":{"applicability":"required","items":["Vercy registry: vr.tr.electron-microprobe","Wikidata: Q911272 (https://www.wikidata.org/wiki/Q911272)"]},"properties":{"applicability":"required","items":["Electron source configuration: Source technology and installed electron-optical configuration","Accelerating voltage: kV; distinguish supported range from selected setting","Probe current and stability: nA and percentage change over a stated interval","Beam footprint: µm at stated voltage, current and focusing conditions","X-ray spectrometer complement: Number and configuration of wavelength-dispersive and energy-dispersive channels","Element and line capability: Element-X-ray-line pairs linked to suitable spectrometer settings and validated methods","Specimen accommodation: Holder dimensions, height clearance and stage travel in mm","Vacuum readiness: Venting, pumping, ready or fault, with pressure in Pa for each monitored region","Analytical performance: Detection limit, precision and uncertainty in stated composition units under a specified method","Calibration and reference materials: Links to reference materials, calibration records and verification results","Protection and service status: Ready, restricted, faulted or under service, with affected subsystem and evidence"]},"recognition":{"applicability":"required","items":["A large instrument with a vertical electron column and several X-ray spectrometers around it.","Connected to a sample airlock, a vacuum system and control computers."]},"capabilities":{"applicability":"required","items":["Assess whether a proposed specimen, element list and spatial scale fit the installed analytical configuration.","Plan point analyses, traverses and elemental maps within verified stage and beam limits.","Select candidate X-ray lines, standards and background measurements for qualified operator review.","Check calibration, beam stability and specimen condition before accepting quantitative results.","Identify whether an apparent compositional feature could arise from overlap, charging, contamination or beam damage.","Recommend authorised maintenance or suspension of analysis when readiness evidence fails."]},"hazards":{"applicability":"required","items":["X-ray leakage if shielding or interlocks are faulty.","High voltage and vacuum hazards during maintenance."]},"interfaces":{"applicability":"required","items":["ISO 22489, Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy, International Organization for Standardization."]},"context":{"applicability":"required","items":["An electron microprobe is used in geology, metallurgy and materials research to measure local elemental composition in solid specimens.","It supports quantitative spot analyses and elemental mapping of features such as mineral grains, alloy phases and inclusions."]}},"sources":[{"title":"Wikidata item Q911272: electron microprobe","url":"https://www.wikidata.org/wiki/Q911272","note":"identity and sense of the item"},{"title":"Wikipedia: Electron probe microanalysis","url":"https://en.wikipedia.org/wiki/Electron_probe_microanalysis","note":"general description of the item"}],"openQuestions":["Does an existing Vercy world model already cover electron microprobes or electron probe microanalysers, requiring this registry entry to link to it?","What authoritative classification should settle the overlap between a dedicated electron microprobe and a quantitatively configured analytical SEM?","Which standards, issuing bodies and jurisdiction-specific requirements apply to quantitative microanalysis and instrument protection?","What sourced operating ranges, specimen dimensions and analytical performance examples represent common configurations without becoming universal requirements?","Which specialist capabilities, such as light-element analysis or additional signal detectors, warrant optional extensions rather than inclusion in the core kind?"],"resources":{"spec":"/models/things/publications/thing-q911272/spec.json"},"provenance":{"origin":"thing registry research (pass 2)","builtFrom":["models/things/publications/thing-q911272/spec.json"],"providers":["Codex"],"researchStatus":"unreviewed","generatedAt":"2026-09-12T09:26:55Z","builder":"tools/build_cards.py@1.0.0"},"completeness":{"sections":{"classifiers":"filled","whatItIs":"filled","purpose":"filled","distinguishingFeatures":"filled","structure":"filled","agentConduct":"filled","ethics":"filled","owners":"filled","relations":"filled","interaction.identity":"filled","interaction.properties":"filled","interaction.recognition":"filled","interaction.capabilities":"filled","interaction.hazards":"filled","interaction.interfaces":"filled","interaction.context":"filled","sources":"filled"},"notes":{"_gate":"Published through the thing publication gate 1.0 on 2026-10-07T10:10:33+00:00: completeness 1.00; sense: Wikidata description; 2 live sources; review by codex: pass"},"score":1.0}}