{ "vercy": "1.0-draft", "publication": { "status": "research-draft", "adjudicationStatus": "unreviewed", "publishableCanonical": false, "generatedAt": "2026-09-12T09:26:55Z", "providers": [ "Codex" ], "breadth": "recalled by Codex without web access - no source was read", "missingProviders": [], "pass": 2, "cost": { "grok": { "seconds": 22.8, "error": "Reading additional input from stdin...\nOpenAI Codex v0.153.4\n--------\nworkdir: R:\\02_PROJECTS\\02_Meta_Models_Platforms\\Ver.cy\\current\\thing-registry-backlog\nmodel: gpt-6-astra\nprovider: openai\napproval: never\nsandbox: read-only\nreasoning effort: none\nreasoning summaries: none\nsession id: 01a094ef-ed42-7db2-8a38-fbedb44e64c2\n--------\nuser\nDescribe what is already known about one registered thing. Answer as JSON only, no prose around it.\n\nThing: electron microprobe\nSense to describe: (none recorded)\nDomain code: PHY.OBJ\nAlso known as: (none)\n\n\nContext for this batch of 1001 things:\n# Batch 043: ", "usd": 0.0, "recall": true }, "codex": { "seconds": 68.4, "error": "Reading additional input from stdin...\nOpenAI Codex v0.153.4\n--------\nworkdir: R:\\02_PROJECTS\\02_Meta_Models_Platforms\\Ver.cy\\current\\thing-registry-backlog\nmodel: gpt-6-astra\nprovider: openai\napproval: never\nsandbox: read-only\nreasoning effort: none\nreasoning summaries: none\nsession id: 01a094ef-ed38-7a31-94bc-44dc90a89c7b\n--------\nuser\nYou are drafting a Vercy meta-model for one registered thing. Answer as JSON only, no prose around it.\n\nThing: electron microprobe\nRegistry id: vr.tr.electron-microprobe\nPlane / domain: PHY / PHY.OBJ\nRegistry definition: (none recorded)\nNames folded into this " } }, "enrichment": { "pass": 3, "engine": "claude", "producedAt": "2026-10-06T12:00:00Z", "ingestedAt": "2026-10-06T08:49:44+00:00", "fields": [ "agent_conduct", "ethics", "failure_modes_and_hazards", "owners", "standards_and_regulation", "visual_identification" ] }, "gate": { "passed": true, "version": "1.0", "at": "2026-10-07T10:10:33+00:00", "evidence": [ "completeness 1.00", "sense: Wikidata description", "2 live sources", "review by codex: pass" ] } }, "metaModel": { "id": "THING-Q911272", "registryId": "vr.tr.electron-microprobe", "name": "electron microprobe", "version": "0.1.0-research.1", "entryKind": "thing", "family": "Thing Registry", "domain": [ "PHY.OBJ" ], "status": "research-draft" }, "canonicalUrl": "https://ver.cy/models/thing/q911272/", "model": { "registry_id": "vr.tr.electron-microprobe", "name": "electron microprobe", "purpose": "Enable an agent to recognise an electron microprobe, assess its analytical readiness and determine which local elemental measurements it can support.", "definition": "An electron microprobe is an analytical instrument that determines the elemental composition of microscopic regions of a solid specimen by measuring characteristic X-rays generated by a focused electron beam.", "scope_statement": "This model owns the registered instrument kind electron microprobe, including its electron-excited X-ray analysis capabilities, specimen interface, calibration dependencies and operating constraints; product configurations and individual units instantiate this kind.", "in_scope": [ "Electron-beam generation, focusing and delivery to a specimen", "Characteristic X-ray detection and spectrometer configuration", "Specimen positioning, preparation compatibility and vacuum interface", "Quantitative elemental analysis, calibration and measurement limitations", "Instrument readiness, maintenance dependencies and protective controls" ], "out_of_scope": [ "Individual manufacturers, product lines and asset histories as independent things", "Specimen identity, geological interpretation and material classification", "Standalone specimen polishing and coating equipment", "General scanning electron microscopy capabilities unrelated to microprobe analysis", "Transmission electron microscopy and ion-beam microanalysis instruments", "Laboratory accreditation and organisational safety management" ], "distinguishing_features": [ "Uses an electron beam incident on a specimen to excite characteristic X-rays for local elemental analysis, rather than using incident X-rays as an X-ray fluorescence instrument does.", "Is configured around electron probe X-ray microanalysis and quantitative analytical stability; an SEM carrying an X-ray detector is an overlapping neighbour whose classification requires evidence beyond detector presence.", "Commonly incorporates wavelength-dispersive spectrometers; record the actual configuration because detector type alone does not settle the boundary with an analytical SEM.", "Analyses local regions of a mounted specimen rather than requiring the electron-transparent specimen geometry characteristic of transmission electron microscopy.", "Measures elemental signals; elemental composition alone does not establish molecular identity, mineral phase or crystal structure." ], "characteristics": [ { "name": "Electron source configuration", "kind": "category", "unit_or_values": "Source technology and installed electron-optical configuration", "why_it_matters": "Constrains beam brightness, stability, maintenance and achievable analytical conditions." }, { "name": "Accelerating voltage", "kind": "measurement", "unit_or_values": "kV; distinguish supported range from selected setting", "why_it_matters": "Affects X-ray excitation, specimen interaction volume and beam-induced damage." }, { "name": "Probe current and stability", "kind": "measurement", "unit_or_values": "nA and percentage change over a stated interval", "why_it_matters": "Controls count rates and whether calibration remains comparable to specimen measurements." }, { "name": "Beam footprint", "kind": "measurement", "unit_or_values": "µm at stated voltage, current and focusing conditions", "why_it_matters": "Defines beam placement requirements but must not be mistaken for the full X-ray generation volume." }, { "name": "X-ray spectrometer complement", "kind": "category", "unit_or_values": "Number and configuration of wavelength-dispersive and energy-dispersive channels", "why_it_matters": "Determines available spectral measurements and acquisition options." }, { "name": "Element and line capability", "kind": "relation", "unit_or_values": "Element-X-ray-line pairs linked to suitable spectrometer settings and validated methods", "why_it_matters": "Prevents treating every element as measurable under every configuration." }, { "name": "Specimen accommodation", "kind": "measurement", "unit_or_values": "Holder dimensions, height clearance and stage travel in mm", "why_it_matters": "Determines whether a specimen can be mounted and positioned without collision." }, { "name": "Vacuum readiness", "kind": "state", "unit_or_values": "Venting, pumping, ready or fault, with pressure in Pa for each monitored region", "why_it_matters": "Governs electron-source operation and specimen admission." }, { "name": "Analytical performance", "kind": "measurement", "unit_or_values": "Detection limit, precision and uncertainty in stated composition units under a specified method", "why_it_matters": "Supports fitness-for-purpose decisions without inventing a universal instrument detection limit." }, { "name": "Calibration and reference materials", "kind": "relation", "unit_or_values": "Links to reference materials, calibration records and verification results", "why_it_matters": "Makes quantitative results traceable to the conditions and standards used." }, { "name": "Protection and service status", "kind": "state", "unit_or_values": "Ready, restricted, faulted or under service, with affected subsystem and evidence", "why_it_matters": "Separates analytical availability from permission to energise or operate the instrument." } ], "affordances": [ "Assess whether a proposed specimen, element list and spatial scale fit the installed analytical configuration.", "Plan point analyses, traverses and elemental maps within verified stage and beam limits.", "Select candidate X-ray lines, standards and background measurements for qualified operator review.", "Check calibration, beam stability and specimen condition before accepting quantitative results.", "Identify whether an apparent compositional feature could arise from overlap, charging, contamination or beam damage.", "Recommend authorised maintenance or suspension of analysis when readiness evidence fails." ], "agent_conduct": { "may": [ "Operate and calibrate an electron microprobe the agent is authorized to use.", "Report compositions with the standards, conditions and uncertainty used." ], "must_not": [ "Disable interlocks or shielding on the instrument.", "Report results beyond the precision the standards and calibration support.", "Alter or omit analyses to change a conclusion." ], "requires_human": [ "Releasing analyses used in legal, safety or commercial decisions.", "Servicing parts of the instrument that involve X-ray or high-voltage exposure." ] }, "ethics": { "considerations": [ "The instrument produces X-rays; interlocks protect operators and others.", "Its results can decide the value of ore, the cause of a failure or a forensic question." ], "affected_parties": [ "Operators and laboratory staff", "People relying on the results" ] }, "owners": { "steward": "The laboratory that operates it; radiation protection rules apply to it.", "master_systems": [] }, "visual_identification": [ "A large instrument with a vertical electron column and several X-ray spectrometers around it.", "Connected to a sample airlock, a vacuum system and control computers." ], "failure_modes_and_hazards": [ "X-ray leakage if shielding or interlocks are faulty.", "High voltage and vacuum hazards during maintenance." ], "standards_and_regulation": [ "ISO 22489, Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy, International Organization for Standardization." ], "what_it_is_for": [ "An electron microprobe is used in geology, metallurgy and materials research to measure local elemental composition in solid specimens.", "It supports quantitative spot analyses and elemental mapping of features such as mineral grains, alloy phases and inclusions." ] }, "sources": [ { "id": "wikidata", "title": "Wikidata item Q911272: electron microprobe", "url": "https://www.wikidata.org/wiki/Q911272", "url_status": "live", "what_it_supports": "identity and sense of the item", "checked_by": "wikidata-api" }, { "id": "wikipedia-en", "title": "Wikipedia: Electron probe microanalysis", "url": "https://en.wikipedia.org/wiki/Electron_probe_microanalysis", "url_status": "live", "what_it_supports": "general description of the item", "checked_by": "wikidata-api sitelink" } ], "structure": { "bundles": [ { "id": "analytical-identity", "name": "Analytical identity", "description": "Establishes what makes the registered kind an electron microprobe and where its analytical claims stop.", "rationale": "The closest neighbour, an SEM with X-ray analysis, shares components and requires an explicit boundary.", "layers": [ { "id": "instrument-kind", "name": "Instrument kind", "description": "Separates the analytical instrument kind from adjacent instruments and particular implementations.", "findings": [ { "id": "microprobe-classification", "name": "Microprobe classification", "description": "Record evidence for classification by analytical purpose and configuration, including overlap with analytical SEMs.", "questions": [ { "text": "What documented purpose and configuration identify this instrument as an electron microprobe?", "kind": "definition", "id": "microprobe-classification-q01" }, { "text": "Where does the registry place the boundary between this kind and an SEM equipped for quantitative X-ray microanalysis?", "kind": "boundary", "id": "microprobe-classification-q02" } ] } ] }, { "id": "signal-and-inference", "name": "Signal and inference", "description": "Connects measured X-rays to the conclusions the instrument can support.", "findings": [ { "id": "elemental-evidence", "name": "Elemental evidence", "description": "Distinguish measured spectral intensities, inferred composition and interpretations requiring additional evidence.", "questions": [ { "text": "Which outputs are measured intensities and which are calculated elemental concentrations?", "kind": "definition", "id": "elemental-evidence-q01" }, { "text": "Which proposed phase, bonding or structural conclusions require a neighbouring analytical method?", "kind": "boundary", "id": "elemental-evidence-q02" } ] } ] } ] }, { "id": "electron-probe-delivery", "name": "Electron probe delivery", "description": "Describes how beam conditions produce and localise the analytical excitation.", "rationale": "Beam settings affect excitation, spatial interpretation, count rates and specimen alteration together.", "layers": [ { "id": "source-and-beam-control", "name": "Source and beam control", "description": "Captures supported settings and evidence of beam stability.", "findings": [ { "id": "usable-beam-conditions", "name": "Usable beam conditions", "description": "Record voltage, current and focus conditions as a coupled operating envelope.", "questions": [ { "text": "What voltage, probe current and beam diameter combinations are supported for the intended analysis?", "kind": "measurement", "id": "usable-beam-conditions-q01" }, { "text": "How is current measured, and what drift criterion requires correction or recalibration?", "kind": "action", "id": "usable-beam-conditions-q02" } ] } ] }, { "id": "specimen-interaction", "name": "Specimen interaction", "description": "Distinguishes beam footprint from the volume contributing X-rays.", "findings": [ { "id": "analytical-localisation", "name": "Analytical localisation", "description": "Record the evidence needed to attribute a measurement to a feature without mixing neighbouring material.", "questions": [ { "text": "What estimate or measurement supports the X-ray generation volume for this material, voltage and selected line?", "kind": "measurement", "id": "analytical-localisation-q01" }, { "text": "When must analysis near an interface, thin layer or small inclusion be rejected or qualified?", "kind": "action", "id": "analytical-localisation-q02" } ] } ] } ] }, { "id": "x-ray-quantification", "name": "X-ray quantification", "description": "Connects spectrometer capabilities, standards and corrections to defensible composition measurements.", "rationale": "Spectral counts become quantitative composition only through method-specific calibration and treatment of interferences.", "layers": [ { "id": "spectral-acquisition", "name": "Spectral acquisition", "description": "Records accessible lines and the acquisition conditions needed to distinguish them.", "findings": [ { "id": "line-and-background-selection", "name": "Line and background selection", "description": "Associate each target element with a usable line, detector configuration and interference assessment.", "questions": [ { "text": "Which installed spectrometer, analysing crystal or detector configuration can measure each proposed line?", "kind": "measurement", "id": "line-and-background-selection-q01" }, { "text": "What peak overlaps, background features and count-rate effects must the acquisition method address?", "kind": "action", "id": "line-and-background-selection-q02" } ] } ] }, { "id": "calibration-and-validity", "name": "Calibration and validity", "description": "Makes the reference basis and limitations of reported concentrations explicit.", "findings": [ { "id": "quantitative-traceability", "name": "Quantitative traceability", "description": "Link results to reference compositions, correction methods and independent verification.", "questions": [ { "text": "Which reference materials, assigned compositions and matrix-correction method support the analysis?", "kind": "provenance", "id": "quantitative-traceability-q01" }, { "text": "What verification results establish precision, detection limits and uncertainty for the target elements and matrix?", "kind": "measurement", "id": "quantitative-traceability-q02" }, { "text": "What failed checks require restandardisation, remeasurement or qualification of the result?", "kind": "action", "id": "quantitative-traceability-q03" } ] } ] } ] }, { "id": "specimen-and-positioning", "name": "Specimen and positioning", "description": "Defines specimen acceptance and reliable placement of measurements.", "rationale": "Surface geometry, electrical behaviour and beam sensitivity can invalidate otherwise correct instrument settings.", "layers": [ { "id": "specimen-acceptance", "name": "Specimen acceptance", "description": "Captures mounting, surface and vacuum compatibility.", "findings": [ { "id": "prepared-surface-suitability", "name": "Prepared surface suitability", "description": "Assess the actual prepared specimen against the intended quantitative method.", "questions": [ { "text": "Are specimen dimensions, surface relief, mounting materials and outgassing compatible with the holder and analysis?", "kind": "measurement", "id": "prepared-surface-suitability-q01" }, { "text": "What conductive path or coating is needed, and how could that coating affect the selected X-ray measurements?", "kind": "action", "id": "prepared-surface-suitability-q02" } ] } ] }, { "id": "targeting-and-exposure", "name": "Targeting and exposure", "description": "Controls where measurements occur and how exposure affects their validity.", "findings": [ { "id": "repeatable-undisturbed-targets", "name": "Repeatable and undisturbed targets", "description": "Record target registration, stage constraints and evidence of specimen change during acquisition.", "questions": [ { "text": "How are image coordinates registered to stage positions and the required analytical focus?", "kind": "measurement", "id": "repeatable-undisturbed-targets-q01" }, { "text": "What time-dependent signal changes indicate charging, contamination, elemental migration or beam damage?", "kind": "measurement", "id": "repeatable-undisturbed-targets-q02" }, { "text": "When should current, beam diameter, dwell time or target location change to preserve a usable measurement?", "kind": "action", "id": "repeatable-undisturbed-targets-q03" } ] } ] } ] }, { "id": "operational-readiness", "name": "Operational readiness", "description": "Relates electron-source, vacuum, spectrometer and protective-system condition to permitted operation.", "rationale": "A microprobe can produce signals while being analytically unfit or unsafe to operate.", "layers": [ { "id": "subsystem-health", "name": "Subsystem health", "description": "Tracks dependencies whose degradation affects beam delivery or X-ray measurement.", "findings": [ { "id": "analytical-service-condition", "name": "Analytical service condition", "description": "Record configuration-specific checks and maintenance evidence for critical subsystems.", "questions": [ { "text": "Which vacuum, source-emission, spectrometer-positioning and detector checks demonstrate readiness?", "kind": "measurement", "id": "analytical-service-condition-q01" }, { "text": "Which source parts, apertures, pumps, detector gases or other consumables apply to this configuration, and what triggers service?", "kind": "action", "id": "analytical-service-condition-q02" } ] } ] }, { "id": "protective-operation", "name": "Protective operation", "description": "Records protective controls and the evidence governing operation and service.", "findings": [ { "id": "energisation-and-access", "name": "Energisation and access", "description": "Connect high-voltage and X-ray protection, vacuum sequencing and access restrictions to allowed actions.", "questions": [ { "text": "Which interlocks and verified conditions are required before beam energisation, chamber venting or specimen exchange?", "kind": "action", "id": "energisation-and-access-q01" }, { "text": "Which manufacturer instructions, issuing-body standards and local requirements govern this configuration?", "kind": "provenance", "id": "energisation-and-access-q02" }, { "text": "Which faults require shutdown or qualified service before analytical work resumes?", "kind": "action", "id": "energisation-and-access-q03" } ] } ] } ] }, { "id": "evidence-and-external-alignment", "name": "Evidence and external alignment", "description": "What the world already says about this thing, gathered so the model can be checked against it.", "rationale": "A model that cannot be lined up against existing standards, identifiers and practice cannot be adopted by anyone who already uses them.", "layers": [ { "id": "reported-evidence", "name": "Reported evidence", "description": "Findings from the breadth pass, kept separate from the structural claims.", "findings": [ { "id": "evidence-confidence-notes", "name": "Check these first", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ "Numerical ranges are representative operating values, not universal specifications; analytical sampling dimensions are generally larger than the focused beam diameter.", "Confirm the applicable editions and instrument-specific applicability of the named standards.", "This is a recall-based description; no sources were consulted." ], "questions": [ { "id": "evidence-confidence-notes-q01", "text": "Which of these check these first hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-kinds", "name": "Kinds and varieties", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ "Thermionic-source electron microprobe", "Field-emission electron microprobe" ], "questions": [ { "id": "evidence-kinds-q01", "text": "Which of these kinds and varieties hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-standards-and-regulation", "name": "Standards and regulation", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ "ISO 22489, issued by the International Organization for Standardization, addresses quantitative point analysis of bulk specimens using wavelength-dispersive electron-probe microanalysis.", "IEC 61010-1, issued by the International Electrotechnical Commission, sets general safety requirements for electrical equipment for measurement, control and laboratory use." ], "questions": [ { "id": "evidence-standards-and-regulation-q01", "text": "Which of these standards and regulation hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-real-world-use", "name": "Real-world use", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ "Quantitative analysis of minerals and glasses in rocks and meteorites.", "Measurement of elemental zoning within individual mineral grains.", "Characterization of phases, inclusions and compositional segregation in alloys.", "Analysis of ceramics, electronic materials and industrial contaminants.", "Production of spatially resolved elemental maps." ], "questions": [ { "id": "evidence-real-world-use-q01", "text": "Which of these real-world use hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-measurements", "name": "Typical measurements", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ { "quantity": "Accelerating voltage for routine analysis", "typical_range": "10-30", "unit": "kV" }, { "quantity": "Probe current for routine quantitative analysis", "typical_range": "10-100", "unit": "nA" }, { "quantity": "Characteristic analytical sampling dimension in bulk specimens", "typical_range": "Approximately 1-5, strongly dependent on composition and accelerating voltage", "unit": "µm" }, { "quantity": "Detection limit for favorable wavelength-dispersive measurements", "typical_range": "Approximately 100-1000, dependent on element, matrix, current and counting time", "unit": "µg/g" } ], "questions": [ { "id": "evidence-measurements-q01", "text": "Which of these typical measurements hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-failure-modes-and-hazards", "name": "Failure modes and hazards", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ "Specimen charging can deflect the beam and distort measurements; insulating specimens commonly require a conductive coating.", "Electron irradiation can cause heating, volatilization, elemental migration or other specimen damage.", "Spectral overlaps, unsuitable reference materials and incorrect matrix corrections can bias reported compositions.", "Vacuum leaks, contamination, source deterioration and spectrometer misalignment can reduce stability and analytical performance.", "High voltages and generated X-rays require protective enclosures and functioning safety interlocks." ], "questions": [ { "id": "evidence-failure-modes-and-hazards-q01", "text": "Which of these failure modes and hazards hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] }, { "id": "evidence-neighbours", "name": "Neighbouring kinds and how to tell them apart", "description": "Recalled without web access and unsourced; every item is a lead to verify.", "evidence": [ { "name": "Scanning electron microscope", "difference": "A scanning electron microscope is primarily configured for imaging, often with X-ray analysis added; an electron microprobe is optimized for stable, calibrated quantitative X-ray microanalysis, usually with multiple wavelength-dispersive spectrometers." }, { "name": "Electron-probe microanalysis", "difference": "Electron-probe microanalysis is the analytical method; an electron microprobe is an instrument used to perform it." }, { "name": "X-ray fluorescence spectrometer", "difference": "An X-ray fluorescence spectrometer excites characteristic X-rays using incident X-rays rather than a focused electron beam." }, { "name": "Ion microprobe", "difference": "An ion microprobe uses a focused ion beam, commonly measuring sputtered secondary ions and their isotopic composition." } ], "questions": [ { "id": "evidence-neighbours-q01", "text": "Which of these neighbouring kinds and how to tell them apart hold for the sense of electron microprobe this model covers, and on what evidence?", "kind": "provenance" } ] } ] } ] } ] }, "openQuestions": [ "Does an existing Vercy world model already cover electron microprobes or electron probe microanalysers, requiring this registry entry to link to it?", "What authoritative classification should settle the overlap between a dedicated electron microprobe and a quantitatively configured analytical SEM?", "Which standards, issuing bodies and jurisdiction-specific requirements apply to quantitative microanalysis and instrument protection?", "What sourced operating ranges, specimen dimensions and analytical performance examples represent common configurations without becoming universal requirements?", "Which specialist capabilities, such as light-element analysis or additional signal detectors, warrant optional extensions rather than inclusion in the core kind?" ], "statistics": { "bundles": 6, "layers": 11, "findings": 17, "questions": 30 } }